Thin-Film Multilayer (TFM) Model: TFM is a free program to compute the reflectance from a stack of thin films. We have applied the TFM model in simulating the specular optical reflection from moth-eye antireflection coatings. The program is self-documented. You can run the main program thinfilm_tests.m which will call reflectance.m under Matlab environment.

thinfilm_tests.m
reflectance.m

Rigorous Coupled-Wave Analysis (RCWA) Model: RCWA is a free program to analyze and design diffractive structures. It is an exact solution of Maxwell’s equations for the electromagnetic diffraction by grating structures. It has been applied to transmission and reflection planar dielectric and/or absorption holographic gratings, arbitrarily profiled dielectric and/or metallic surface-relief gratings, multiplexed holographic gratings, two-dimensional surface-relief gratings, and anisotropic gratings, for both planar and conical diffraction. We have applied the RCWA model for calculating the optical reflection from subwavelength silicon antireflection coatings. The program is self-documented. You can run the main program rcwa_tests.m which will call rcwa.m under Matlab environment.

rcwa.m
rcwa_tests.m