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UF Chemical Engineering


The University of Florida


 

 

 

 

 

Open Source Software Developed by Our Group with Support from the National Science Foundation under Grant No. 0744879 and No. 1000686

 

Thin-Film Multilayer (TFM) Model: TFM is a free program to compute the reflectance from a stack of thin films. We have applied the TFM model in simulating the specular optical reflection from moth-eye antireflection coatings. The program is self-documented. You can run the main program thinfilm_tests.m which will call reflectance.m under Matlab environment.

thinfilm_tests.m
reflectance.m

Rigorous Coupled-Wave Analysis (RCWA) Model: RCWA is a free program to analyze and design diffractive structures. It is an exact solution of Maxwell’s equations for the electromagnetic diffraction by grating structures. It has been applied to transmission and reflection planar dielectric and/or absorption holographic gratings, arbitrarily profiled dielectric and/or metallic surface-relief gratings, multiplexed holographic gratings, two-dimensional surface-relief gratings, and anisotropic gratings, for both planar and conical diffraction. We have applied the RCWA model for calculating the optical reflection from subwavelength silicon antireflection coatings. The program is self-documented. You can run the main program rcwa_tests.m which will call rcwa.m under Matlab environment.

rcwa.m
rcwa_tests.m

Modified Kelvin Model: The modified Kelvin model is a free program to calculate the two principal radii (rc and x) characterizing the saddle-shaped liquid-vapor interface of condensed liquid between two touching spheres. Please refer to our recent work on "Vapor Detection Enabled by Colloidal Photonic Crystals" for more details.

linearity.m