Thin-Film Multilayer
(TFM) Model: TFM
is a free program to compute the reflectance from a stack of thin films. We
have applied the TFM model in simulating the specular optical reflection
from moth-eye antireflection coatings. The program is self-documented. You
can run the main program thinfilm_tests.m which will call reflectance.m
under Matlab environment.
thinfilm_tests.m
reflectance.m
Rigorous Coupled-Wave
Analysis (RCWA) Model: RCWA is a free program to analyze and design diffractive
structures. It is an exact solution of Maxwell’s equations for the
electromagnetic diffraction by grating structures. It has been applied to
transmission and reflection planar dielectric and/or absorption holographic
gratings, arbitrarily profiled dielectric and/or metallic surface-relief
gratings, multiplexed holographic gratings, two-dimensional surface-relief
gratings, and anisotropic gratings, for both planar and conical
diffraction. We have applied the RCWA model for calculating the optical
reflection from subwavelength silicon antireflection coatings. The program
is self-documented. You can run the main program rcwa_tests.m which will
call rcwa.m under Matlab environment.
rcwa.m
rcwa_tests.m
Modified Kelvin Model: The modified Kelvin model is a free
program to calculate the two principal
radii (rc and x) characterizing the saddle-shaped
liquid-vapor interface of condensed liquid between two touching spheres.
Please refer to our recent work on "Vapor Detection Enabled by
Colloidal Photonic Crystals" for more details.
linearity.m
