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Timothy J. Anderson
Professor & Associate Dean
Ph.D., 1979, University of California-Berkeley
Electronic materials processing
Thermochemistry and phase diagrams
Chemical vapor deposition and bulk crystal growth
Photovoltaics
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Faculty Web Page
- More Information
Brief Description of Current Research
Our group’s current
research efforts are largely devoted to the study of advanced electronic
materials processing issues, particularly those related to thin film
deposition (the group operates one Molecular Beam Epitaxy (MBE) and six
chemical vapor deposition (CVD) systems. In one system we have coupled
a Raman spectrometer to a CVD reactor, which can be x-y-z translated to
measure gas phase composition and temperature profiles. Raman
scattering and LIF, along with reactor modeling, are being used to
quantitatively study homogeneous thermal decomposition mechanisms of
organometallic precursors. These reaction mechanisms and rate constants
are then used to optimize reactor designs and operating conditions.
Current studies are focused on the thermal decomposition of column II
and III alkyls.
Two of the CVD reactors (commercial metalorganic and hydride vapor phase epitaxy)
are devoted to the growth of GaN and related materials. These wide-bandgap
materials are of interest for visible and UV light emitting devices as well as
high-temperature and high-power applications. Current projects include growth
of thick GaN on Si, nucleation and growth of GaN and InN nanorods, and exploring
the growth characteristics and properties of InN.
The performance
and functionality of integrated circuits (IC) have continuously improved over
the last three decades in part through reduction in the physical sizes of
features. This reduction has motivated the use of copper metallization schemes
to increase conductivity, but brings the need for barrier layers to prevent Cu
diffusion into the underlying Si or interlevel dielectric. An NSF Collaborative Research in Chemistry program is supporting work in
the development of new precursors to deposit barrier layers (e.g., TaN, WN, LaB6).
The industry roadmap requires the barrier film thickness to be ~10% of the
minimum feature size, with the next node at 40 nm. To meet conformality
requirements at this node, atomic layer deposition (ALD) methods are
being studied, including understanding self-limiting adsorption.
The quality of
bulk crystals grown from the melt is largely controlled by buoyancy driven
flows. Unfortunately, there are very few techniques to visualize flows in
opaque, high temperature, and low Pr number semiconductor melts. In a NASA
funded program, we are using YSZ solid-state electrochemical cells, placed along
the walls of the liquid metal container, to introduce, extract, and monitor
dilute concentrations of dissolved atomic oxygen at the sub-ppm level to
visualize flow. Coupling the measured values of the concentration of this
tracer species as a function of time and location with a detailed model allows
the flow dynamics to be estimated. In addition, we are constructing an
integrated microsensor system to study short -dimension dynamics in small
systems (e.g. drops).
We are
participating in collaboration with the Electrical and Materials Sciences
departments on research to reduce the costs of manufacturing photovoltaic solar
cells based on Cu(In,Ga)Se2 (CIGS)
thin film technology. This interdisciplinary program aims to probe fundamental
issues such as reaction pathways, point defect chemistry, and phase equilibria,
while exploring alternative processes such as MBE, rapid thermal processing,
laser annealing, and ALD. Another program is focused on demonstrating tandem
solar cells. In this approach, photon-energy in the different wavelength regions
of the solar spectrum are more efficiently converted into electricity by using a
stack of single-junction solar cells. Our vision is a tandem structure
consisting of a CIS (1.04 eV) bottom cell and a CGS (1.68 eV) top cell. In
other research, the use of InxGa1-xN solid solutions are
being tested as possible PV materials, and organic PV cells are attempting to be
integrated with inorganic ones.
The
solution to many of the problems in the processing of advanced materials is
aided by knowledge of the phase diagram and thermochemistry of these materials.
Our group routinely measures component activities in liquid and solid solutions
with solid state galvanic cells. This data along with other available data is
then critically assessed and solution model parameters estimated to predict
multicomponent phase diagrams and compute complex reaction equilibria. We also
routinely perform molecular simulations in experimentally difficult systems.
Selected Publications
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“WNxCy Thin Films. Correlation of Precursor
Fragmentation to Film Properties," O.J. Bchir, K.M. Green, H.M.
Ajmera, E.A. Zapp, T.J. Anderson, B.C. Brooks, L.L. Reitfort, D.H.
Powell, K.A. Abboud, and L. McElwee-White,
J. Am.
Chem. Soc. (to appear
2005).
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“Numerical
Simulations of Periodic Flow Oscillations in Low Prandtl Number Fluids,” D.
Crunkleton, R. Narayanan, and T.J. Anderson, Int. J. Heat & Mass Transfer
(to appear 2005).
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“Effect of a Cu-Se
Secondary Phase on the Epitaxial Growth of CuInSe2 on (100) GaAs,”
S.
Yoon, S.
Kim, V. Craciun, W. K.
Kim, R. Kaczynski,
R. Acher, T. J. Anderson, O. D. Crisalle, and S. S. Li, J. Crysal.
Growth
(to appear 2005).
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“Investigation of Mass Transport Phenomena in an Upflow Cold-Wall CVD
Reactor by Gas Phase Raman Spectroscopy and Modeling,” J.Y. Hwang, C. Park,
M. Huang and T.J. Anderson, J. Crystal. Growth,
279(3-4), 521-530
(2005).
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“Growth and
Characterization of Single-crystalline Gallium Nitride using (100) LiAlO2
Substrates,”
M.D. Reed, O.M. Kryliouk, M.A. Mastro, and T.J. Anderson, J. Crystal
Growth 274 (1-2), 14-20 (2005).
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“Influence of
polarity on GaN thermal stability,”
M.A. Mastro, O.M. Kryliouk, T.J. Anderson,
A. Davydov, and A. Shapiro, J. Crystal Growth 274 (1-2), 38-46 (2005).
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“The
Influence of Interdiffusion on Strain Energy in the GaN-Sapphire
System,” S.W. Kang, H.Y. Park, T. Kim, T. Dann, O. Kryliouk, and T.
Anderson, phys. stat. sol. (c), 2(7), 2420-2423 (2005).
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“Identification of
a Gallium-Containing Carbon Deposit Produced by Decomposition of Trimethyl
Gallium,” C.-H. Park, J.-H Kim, D. Yoon, S. Han C. Doh, S. Yeo, K.H. Lee,
and T.J. Anderson, J. Electrochem. Soc. 152(5),
C298-C303
(2005).
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